As part of the CEA, LETI (1 600 employees) conducts high-level technological research in the field of micro- and nano-technologies, in particular for telecommunications, communicating objects (mobile phones, wireless networks, smart cards, etc.) and health. CEA-Leti offers a unique innovation ecosystem with the shared technology platforms dedicated to: 300mm/200mm silicon technologies, MEMS/NEMS microsystems, design and, nanocharacterisation.

In the frame of the NFFA Project, CEA-LETI will provide the access to users at its nanocharacterization platform (PFNC). This platform, unique in Europe,  is located on the MINATEC campus and it will offer a unique set of complementary characterisation techniques such as: X-ray analysis (XRD, XRF, XRR, HRXRD), electron microscopy (SEM, HR-SEM, TEM, HR-TEM, STEM, electron holography, electron tomography, EELS, X-EDS), ion beams analysis (SIMS, ToF-SIMS, Atom Probe Tomography), optics (RAMAN, micro-RAMAN, FTIR, Ellipsometry, Spectrophotometry, micro-Photoluminescence, Cathodoluminescence), surface analysis (XPS, UPS, PEEM, k-PEEM, LEED, RHEED, nano AUGER), scaning probe techniques (AFM, KFM, SCM, SSRM, C-AFM) and a sample preparation facility (DB-FIB, Tripod).