3326 |
UAB |
Spain |
Powder X-ray diffractometer “XPert Powder” |
Powder X-ray diffraction |
X-ray tube, Cu anode |
Cu-Kalfa radiation (1.5419 Å) |
PIXcel1D |
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Vertical goniometer theta-theta |
Holders and platforms for powders (20 mg – 2 g), for small pieces, for oxygen or moisture sensitive samples |
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Measurements at room temperature or at non-ambient temperature (from -190°C to 450°C), at ambient or reduced pressure, in special atmospheres |
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3357 |
CEA-LETI |
France |
Hibrix |
X-ray diffraction (phase, stress, texture analysis) of thin films and multilayers materials
X-ray reflectivity (thickness, electronic density, roughness) of thin films and mutilayers
X-ray fluorescence (chemical analysis)
Non ambient condition (heating up to 1100°C under different atmospheres) |
X-ray microsource (50 to 150 micrometers spot size) 50 W with parallel and focusing primary optics (mirrors) |
Copper source (8 keV) |
2D detector (60x60 mm², curved detector (120° aperture / radius 250 mm), fluorescence detector and scintillator |
Kα1-2 spectral lines
Spot size at sample position (50 to 150 ums)
200 eV for fluorescence |
Four circles diffractometers with high angular resolution (0.001°), x,y, (50 mm), z (15 mm) sample stage |
100 mm substrate size or small coupons |
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In situ (temperature) measurements up to 1100°C under primary vacuum or under air, nitrogen, argon, helium atmosphere (1 bar) |
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2611 |
ICN2 |
Spain |
XRD |
X-ray diffraction of nanopowder or thin film/multilayer materials, X-ray Reflectivity, Texture and Stress analysis, Epitaxial films, Grazing incidence, Non-ambient conditions. |
Panalytical X’Pert Pro MPD and MPD diffractometers. Conventional Cu or Co tube. Thin film diffractometer is 4-angle goniometer with low/high resolution optics (2x and 4x Ge(220) crystal monochromators). |
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PIXCel detector (2D solid state detector 256x256 pixels works as 1D detector). Ideal for fast reciprocal space mapping (typical 30 min-1h). |
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From a few mm2 up to 3” diameter flat samples. |
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DHS 1100 Anton Paar hot-stage (RT up to 1000°C), with controlled atmosphere (N2, O2 gas flows, fast gas mixing, wet/dry atmosphere). Compatible with all measurements XRD, texture, XRR, reciprocal space mapping. |
Fast acquisition for phase transformation kinetics (single peak scan in 2-4 sec). High temperature chamber adapted for in-situ measurements with applied voltage/temperature/controlled atmosphere. In-plane diffraction geometry: ideal for exploring ultrathin films of a few nm. |
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3358 |
CEA-LETI |
France |
Smartlab Rigaku |
X-ray diffraction (phase, stress, texture analysis, in plane analysis) of polycristalline and epitaxial thin films and multilayers materials
X-ray reflectivity (thickness, electronic density, roughness) of thin films and mutilayers
X-ray fluorescence (chemical analysis) and Grazing incidence fluorescence (sub-nm in depth chemical profile)
U-SAXS with Bonse-Hart optics
Non ambient condition (heating up to 1100°C under different atmospheres) |
Rotating anode X-ray sources Cu and Mo (9 kW) with parallel and focusing optics |
Copper source (8 keV) and molybdenum source (17 keV) |
2D detector (Pilatus 100K), linear detector (10° aperture / radius 250 mm), fluorescence detector and scintillator |
Kα1-2 spectral lines
Kα1 spectral line with Johansson configuration (Bragg Brentano)
HR-XRD : Ge(220)x2; Ge(220)x4;, Ge(400)x2; Ge(400)x4;
Spot size at sample position (200 microns to few mm²)
200 eV for fluorescence |
Five circles diffractometers with high angular resolution (0.001°), x,y, (50 mm), z (15 mm) sample stage
In plane sample alignment (double Rx, Ry rotation stage) |
100 mm substrate size or small coupons |
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In situ (temperature) measurements up to 1100°C under primary vacuum or under air, nitrogen, argon, helium atmosphere (1 bar) |
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3370 |
DESY |
Germany |
Reflectometer |
Characterization of surfaces, interfaces and coatings |
Lab based Mo source, Mo_Kα |
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Point detector
Strip detector (Mythen) |
Spot size: 12x0.3 mm2 (HxV)
Divergence: 0.4 mrad (V) |
x,y,z, translation
Sample rotations for surface alignment in two directions |
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Mass spectrometer and flux monitors inside mobile X-ray environments |
Mountable mobile X-ray environments for 1) high pressure, 2) catalysis, 3) electro-chemistry |
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Gas dosing inside mountable mobile X-ray environments permitting in-situ catalytic or EC experiments |
2445 |
PSI |
Switzerland |
XRD - MS Beamline @ Swiss Light Source Synchrotron |
The Material Science (MS) beamline serves two endstations for surface diffraction and powder diffraction |
Short-period (14 mm) in-vacuum, cryogenically cooled, permanent magnet undulator, flux at 10eV: 2.5x1013 ph/s/0.4 A, focused spot size 130µm x 40µm (1:1 focusing) |
5 - 38 keV |
PILATUS II novel photon-counting 2-D pixel detector, 486 x 195 pixels, each pixel subtending 0.0086o x 0.0086o, high SNR due to its zero electronic background noise, excellent point spread function; 2+3-circle surface diffractometer from Micro-Controle Newport |
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Horizontal or vertical sample positioning, hexapod for sample positioning and aligning |
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UHV, cryo-chamber |
Choice of filters |
Powder diffraction endstation is also available |
3371 |
DESY |
Germany |
Six-circle Diffractometer |
Full reciprocal space analysis |
Lab based Cu source, Cu_Kα |
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Point detector
Strip detector (Mythen) |
Spot size: 0.25 x 0.25 mm2 (HxV)
Divergence: 5 x 5 mrad² (HxV) |
x,y,z, translation
Angular freedom of six-circle diffractometer geometry |
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Mass spectrometer and flux monitors inside mobile X-ray environments |
Mountable mobile X-ray environments for 1) high pressure, 2) catalysis, 3) electro-chemistry |
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Gas dosing inside mountable mobile X-ray environments permitting in-situ catalytic or EC experiments |
3379 |
CNR-IOM |
Italy |
Four-circle X-ray diffractometer PanalyticalX'pert |
Analysis of a wide range of materials, from micrometer powders to thin films and/or nano-engineered heterostructures |
Cu Kα (1.5405 Å)
Interchangeable fixed slits and one Soller slit |
Cu Kα (1.5405 Å) |
Sealed proportional counter
Fixed slit plus programmable receiving slit
Graphite analyser |
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Open Eulerian cradle:
- incidence angle ± 92˚
- azimuth angle 2 x 360˚
- x,y in plane translation: 100 x 100 mm
- z vertical translation minimum step 1 µm |
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3638 |
CSIC |
Spain |
XRD – D8 Advance |
Texture and microdiffraction measurements |
X-ray Source: Cu anode long fine focus ceramic X-ray tube; running conditions for the X-Ray tube: 40 kV and 40 mA |
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Two-dimensional (2-D) detector –Vantec 500 (window of 140 mm diameter) |
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Centric Eulerian cradle |
Powder, thin films or bulk samples |
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Diferent size collimators (0.1, 0.3 and 0.5mm) |
3639 |
CSIC |
Spain |
XRD – D8 Discover |
X-ray reflectometry
High-resolution X-ray diffraction
Grazing incidence diffraction and texture measurements |
X-ray Source: Cu anode long fine focus ceramic X-ray tube; running conditions for the X-Ray tube: 40 kV and 40 mA |
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LYNXEYE XE-T - High-Resolution Position Sensitive Detector with Energy Resolution (0D, 1D and 2D) |
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Centric Eulerian cradle |
Powder, thin films or bulk samples |
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X-ray 2-Bounce monochromator with high-precision |
3640 |
CSIC |
Spain |
XRD – Siemens D5000 |
Powder diffraction
Out-of-plane and rocking curve measurements of thin films |
X-ray Source: Cu anode long fine focus ceramic X-ray tube, running conditions for the X-Ray tube: 45 kV and 35 mA |
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Scintillation counter |
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Bragg-Brentano geometry |
Powder, thin films or bulk samples (no more than 2cmx2cm) |
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