Powder X-ray diffraction

X-ray tube, Cu anode

Cu-Kalfa radiation (1.5419 Å)

PIXcel1D

Vertical goniometer theta-theta

Holders and platforms for powders (20 mg – 2 g), for small pieces, for oxygen or moisture sensitive samples

Measurements at room temperature or at non-ambient temperature (from -190°C to 450°C), at ambient or reduced pressure, in special atmospheres

X-ray diffraction (phase, stress, texture analysis) of thin films and multilayers materials

X-ray reflectivity (thickness, electronic density, roughness) of thin films and mutilayers

X-ray fluorescence (chemical analysis)

Non ambient condition (heating up to 1100°C under different atmospheres)

X-ray microsource (50 to 150 micrometers spot size) 50 W with parallel and focusing primary optics (mirrors)

Copper source (8 keV)

2D detector (60x60 mm², curved detector (120° aperture / radius 250 mm), fluorescence detector and scintillator

K_α1-2 spectral lines

Spot size at sample position (50 to 150 ums)

200 eV for fluorescence

Four circles diffractometers with high angular resolution (0.001°), x,y, (50 mm), z (15 mm) sample stage

100 mm substrate size or small coupons

In situ (temperature) measurements up to 1100°C under primary vacuum or under air, nitrogen, argon, helium atmosphere (1 bar)

X-ray diffraction of nanopowder or thin film/multilayer materials, X-ray Reflectivity, Texture and Stress analysis, Epitaxial films, Grazing incidence, Non-ambient conditions.

Panalytical X’Pert Pro MPD and MPD diffractometers. Conventional Cu or Co tube. Thin film diffractometer is 4-angle goniometer with low/high resolution optics (2x and 4x Ge(220) crystal monochromators). 

PIXCel detector (2D solid state detector 256x256 pixels works as 1D detector). Ideal for fast reciprocal space mapping (typical 30 min-1h).

From a few mm² up to 3” diameter flat samples.

DHS 1100 Anton Paar hot-stage (RT up to 1000°C), with controlled atmosphere (N₂, O₂ gas flows, fast gas mixing, wet/dry atmosphere). Compatible with all measurements XRD, texture, XRR, reciprocal space mapping.

Fast acquisition for phase transformation kinetics (single peak scan in 2-4 sec). High temperature chamber adapted for in-situ measurements with applied voltage/temperature/controlled atmosphere. In-plane diffraction geometry: ideal for exploring ultrathin films of a few nm.

X-ray diffraction (phase, stress, texture analysis, in plane analysis) of polycristalline and epitaxial thin films and multilayers materials

X-ray reflectivity (thickness, electronic density, roughness) of thin films and mutilayers

X-ray fluorescence (chemical analysis) and Grazing incidence fluorescence (sub-nm in depth chemical profile)

U-SAXS with Bonse-Hart optics

Non ambient condition (heating up to 1100°C under different atmospheres)

Rotating anode X-ray sources Cu and Mo (9 kW) with parallel and focusing optics

Copper source (8 keV) and molybdenum source (17 keV)

2D detector (Pilatus 100K), linear detector (10° aperture / radius 250 mm), fluorescence detector and scintillator

K_α1-2 spectral lines

K_α1 spectral line with Johansson configuration (Bragg Brentano)

HR-XRD : Ge(220)x2; Ge(220)x4;, Ge(400)x2; Ge(400)x4;

Spot size at sample position (200 microns to few mm²)

200 eV for fluorescence

Five circles diffractometers with high angular resolution (0.001°), x,y, (50 mm), z (15 mm) sample stage

In plane sample alignment (double Rx, Ry rotation stage)

100 mm substrate size or small coupons

In situ (temperature) measurements up to 1100°C under primary vacuum or under air, nitrogen, argon, helium atmosphere (1 bar)

Characterization of surfaces, interfaces and coatings

Lab based Mo source, Mo_K_α

Point detector

Strip detector (Mythen)

Spot size: 12x0.3 mm² (HxV)

Divergence: 0.4 mrad (V)

x,y,z, translation

Sample rotations for surface alignment in two directions

Mass spectrometer and flux monitors inside mobile X-ray environments

Mountable mobile X-ray environments for 1) high pressure, 2) catalysis, 3) electro-chemistry

Gas dosing inside mountable mobile X-ray environments permitting in-situ catalytic or EC experiments

The Material Science (MS) beamline serves two endstations for surface diffraction and powder diffraction

Short-period (14 mm) in-vacuum, cryogenically cooled, permanent magnet undulator, flux at 10eV: 2.5x10¹³ ph/s/0.4 A, focused spot size 130µm x 40µm (1:1 focusing)

5 - 38 keV

PILATUS II novel photon-counting 2-D pixel detector, 486 x 195 pixels, each pixel subtending 0.0086^o x 0.0086^o, high SNR due to its zero electronic background noise, excellent point spread function; 2+3-circle surface diffractometer from Micro-Controle Newport

Horizontal or vertical sample positioning, hexapod for sample positioning and aligning

UHV, cryo-chamber

Choice of filters

Powder diffraction endstation is also available

Full reciprocal space analysis

Lab based Cu source, Cu_K_α

Point detector

Strip detector (Mythen)

Spot size: 0.25 x 0.25 mm² (HxV)

Divergence: 5 x 5 mrad² (HxV)

x,y,z, translation

Angular freedom of six-circle diffractometer geometry

Mass spectrometer and flux monitors inside mobile X-ray environments

Mountable mobile X-ray environments for 1) high pressure, 2) catalysis, 3) electro-chemistry

Gas dosing inside mountable mobile X-ray environments permitting in-situ catalytic or EC experiments

Analysis of a wide range of materials, from micrometer powders to thin films and/or nano-engineered heterostructures

Cu K_α (1.5405 Å)

Interchangeable fixed slits and one Soller slit

Cu K_α (1.5405 Å)

Sealed proportional counter

Fixed slit plus programmable receiving slit

Graphite analyser

Open Eulerian cradle:

- incidence angle ± 92˚

- azimuth angle 2 x 360˚

- x,y in plane translation: 100 x 100 mm

- z vertical translation minimum step 1 µm

Texture and microdiffraction measurements

X-ray Source: Cu anode long fine focus ceramic X-ray tube; running conditions for the X-Ray tube: 40 kV and 40 mA

Two-dimensional (2-D) detector –Vantec 500 (window of 140 mm diameter)

Centric Eulerian cradle

Powder, thin films  or bulk samples

Diferent size collimators (0.1, 0.3 and 0.5mm)

X-ray reflectometry

High-resolution X-ray diffraction

Grazing incidence diffraction and texture measurements

X-ray Source: Cu anode long fine focus ceramic X-ray tube; running conditions for the X-Ray tube: 40 kV and 40 mA

LYNXEYE XE-T - High-Resolution Position Sensitive Detector with Energy Resolution (0D, 1D and 2D)

Centric Eulerian cradle

Powder, thin films  or bulk samples

X-ray 2-Bounce monochromator with high-precision

Powder diffraction

Out-of-plane and rocking curve measurements of thin films

X-ray Source: Cu anode long fine focus ceramic X-ray tube, running conditions for the X-Ray tube: 45 kV and 35 mA

Scintillation counter

Bragg-Brentano geometry

Powder, thin films  or bulk samples (no more than 2cmx2cm)